Specialized Engineers For
Physical Design, DFT Synthesis, and STA

Design for Test (DFT) Services

• Scan implementation (compression/non-compression) using industry standard tools.
• Support from ATE for pattern stabilization, split lot analysis, and structural failure diagnosis (scan, MBIST).
• Formal Verification is used to certify the design accuracy before and after DFT (Design for Testability).
• PLL clocks on the chip were used for testing.
• ATPG (stuck-at, at-speed, SDD, Path delay, new faults based on the technology and strategy) creation of vectors Pattern (Verilog, WGL) simulation (Gate Level Simulations), Coverage analysis (unit-delay, extracted dealy with SDF).
• IEEE 1149.1, IEEE1149.6 compliance test controllers (JTAG).
• For increased yield, a memory redundancy repair procedure and defect diagnostic technologies are used
• BIST Logic

DFT, Synthesis and STA

We have experience across various DFT Techniques like Scan, ATPG, Bist, and Boundary Scan, then make Fiori Technology solutions your first choice.

• Scan Insertion
• Scan Compression
• ATPG, MBIST
• JTAG, B-Scan
• Physical Aware Synth
• Timing Closure
• SI Analysis
• Formal Verification
• Low-power Checks