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Specialized Engineers For
Physical Design, DFT Synthesis, and STA


With a team of specialized engineers of Physical Design, DFT Synthesis, and STA, Fiori Technology solutions can give you a one-stop solution for building all kinds of next-generation leadership products. We help customers accelerate their end-to-end product development with our extensive design capabilities.

Design for Test (DFT) Services

  • Scan implementation (compression/non-compression) using industry standard tools.
  • Support from ATE for pattern stabilization, split lot analysis, and structural failure diagnosis (scan, MBIST).
  • Formal Verification is used to certify the design accuracy before and after DFT (Design for Testability).
  • PLL clocks on the chip were used for testing.
  • ATPG (stuck-at, at-speed, SDD, Path delay, new faults based on the technology and strategy) creation of vectors Pattern (Verilog, WGL) simulation (Gate Level Simulations), Coverage analysis (unit-delay, extracted dealy with SDF).
  • IEEE 1149.1, IEEE1149.6 compliance test controllers (JTAG).
  • For increased yield, a memory redundancy repair procedure and defect diagnostic technologies are used
  • BIST Logic

Physical Design Services

Proficient in implementing complex ASICs in 7nm, 10nm, 14nm, 16nm and 28nm.

  • Die-size Estimation
  • Floor Plan
  • Pad Ring & RDL
  • Partition & Budgeting
  • Power-grid
  • Low-Power
  • Block/Chip Level
  • Clocking
  • Physical Verification

DFT, Synthesis and STA

We have experience across various DFT Techniques like Scan, ATPG, Bist, and Boundary Scan, then make Fiori Technology solutions your first choice.

  • Scan Insertion
  • Scan Compression
  • JTAG, B-Scan
  • Physical Aware Synth
  • Timing Closure
  • SI Analysis
  • Formal Verification
  • Low-power Checks
US Office
5005 W Royal Ln Suite 224,
Irving, TX 75063
India Office
Plot No 133, Sri Hari Nilayam,
Vaishali Nagar, Madinaguda,
Hyderabad - 500049
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